NEXT GENERATION HEADPHONE TESTING FROM G.R.A.S.
25 January 2016
The headphone market is expanding rapidly these years. Advances in technology have allowed for the production of high definition headphones in not just a wide range of types and forms, and have improved performance and connectivity.
For manufacturers, this has given rise to a number of challenges when it comes to testing their products - including the need to test at low and high frequencies, improve repeatability, maintain accurate and reliable data, and shorten product development time.
At G.R.A.S. we have risen to the challenge and are proud to introduce the next generation of headphone testing technology.
Our solution with a new improved pinna and a brand new low noise ear simulator is compatible with the renowned and advanced IEC standardized KEMAR and the versatile and portable 43AG ear and cheek simulator. And it offers a wide range of benefits.
The subtle changes to the pinna, concha and ear canal has resulted in remarkable improvements for research and test engineers.
With the new cutting-edge low noise ear simulator we to bring the noise floor down below the threshold of human hearing, so it is possible to capture everything the golden ears (and most of your customers) can perceive. At the same time we increase the upper frequency limit from todays 711 coupler from 10 kHz to 20 kHz.
43 BB low noise ear simulator
*Based on the IEC standard
*Improved dynamic range: test down to threshold of hearing
*Extends the frequency range up to 20 kHz
*Repeatability at high frequency
*Added SNR at high frequency
*Calibrated and traceable
KB5000/KB5001 new pinna
*Better fit and seal
*More precise measurements
*Based on the IEC Standard
For more information, please contact:
G.R.A.S. Sound & Vibration
2234 E. Enterprise Parkway
Tel: +1 330 4251201