GE Introduces Its phoenix nanotom m: nanoCT® system
11/04/2011 GE Measurement & Control Solutions
Provides 3D analysis and coordinate measurement on a wide industrial and scientific sample rangeWunstorf, Germany. - 5 April 2011 -۠The phoenix nanotom m, from GE's Inspection Technologies business, has been developed in response to the fast growing demand for high resolution and high precision X-ray computed tomography (CT) in non-destructive 3D analysis and dimensional metrology. Featuring fully automated CT scan execution, reconstruction and the analysis process, it offers ease of use as well as fast and reproducible CT results, in applications ranging from small biological and geological samples to medium sized industrial components such as injection nozzles or injection molded plastic parts, even with metal inlays.
As Oliver Brunke, product manager for CT at GE's Inspection Technologies business says, "Compared with current- state-of-the-art nanoCT equipment, such as the nanotom s, the new phoenix system provides significantly better object penetration and image sharpness, as well as fewer imaging artifacts and anomalies because of its extremely high long-term stability. Moreover, due to its excellent contrast-to-noise ratio, CT scans can be performed up to four times faster for the same resolution and image quality."
The nanotom m incorporates a new phoenix 180kV/15W, high power nanofocus X-ray tube, which is optimized for long-term stability and allows scanning of high absorbing materials such as metals and ceramics. The internal cooling of the tube also significantly reduces thermal effects such as drift, to ensure even sharper imaging as well as allowing the long scanning times frequently required in scientific research.
The new CT system also features a very high dynamic range, typically five times better than the current nanotom s, because of its temperature-stabilized, 3072 x 2400 piixel DXR 500L detector from GE. With such a large detector area, this allows sample sizes of up to 250 x 240 mm and the combination of proprietary GE technology in terms of X-ray tube, detector, generator and CT software ensures that a voxel resolution of up to 300 nm (0.3 µm) can be achieved
Comprehensive automatic 3D metrology package available
The phoenix nanotom m can also be supplied with a comprehensive 3D metrology package. This is optimized for stable and reproducible environmental and acquisition condition and provides fast reconstruction and precise measurement results within seconds. It comprises an air-conditioned cabinet and a high accuracy direct measuring system for all linear granite based axes with vibration insulation of the manipulator. It also includes a calibration object and GE's phoenix datos|x 2.0 CT software packages "click & measure|CT" and "metrology". With datos|x 2.0, the entire CT process chain can be fully automated, reducing operator time by a factor of up to five. Once the appropriate setup is programmed, the whole scan and reconstruction process including volume optimization features or surface extraction, runs without any operator interaction. Furthermore, 3D failure analysis or metrology tasks performed with third party programs can be executed automatically. Once programmed, under normal circumstances, automatic creation of a first article inspection report even with complex internal geometries can be provided within an hour.
For further information visit, www.ge-mcs.com
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